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Physics of Plasmas / Volume 19 / Issue 2 / ARTICLES / Magnetically Confined Plasmas, Heating, Confinement

Phys. Plasmas 19, 022505 (2012); http://dx.doi.org/10.1063/1.3685720 (10 pages)

On the mechanism for edge localized mode mitigation by supersonic molecular beam injection

T. Rhee1, J. M. Kwon1, P. H. Diamond1,2, and W. W. Xiao1,3

1WCI Center for Fusion Theory, National Fusion Research Institute, Daejeon 305-333, Korea
2CMTFO and CASS, UCSD, San Diego, California 92093 USA
3Southwestern Institute of Physics, P.O. Box 432, Chengdu, China

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(Received 31 December 2011; accepted 17 January 2012; published online 21 February 2012)

We construct a diffusive, bi-stable cellular automata model to elucidate the physical mechanisms underlying observed edge localized mode (ELM) mitigation by supersonic molecular beam injection (SMBI). The extended cellular automata model reproduces key qualitative features of ELM mitigation experiments, most significantly the increase in frequency of grain ejection events (ELMs), and the decrease in the number of grains ejected by these transport events. The basic mechanism of mitigation is the triggering of small scale pedestal avalanches by additional grain injection directly into the H-mode pedestal. The small scale avalanches prevent the gradient from building-up to marginality throughout the pedestal, thus avoiding large scale transport events which span the full extent of that region. We explore different grain injection parameters to find an optimal SMBI scenario. We show that shallow SMBI deposition is sufficient for ELM mitigation.

© 2012 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. MINIMAL MODEL FOR ELM MITIGATION
  3. ELM MITIGATION IN THE CELLULAR AUTOMATA MODEL
    1. Basic mechanism of the ELM mitigation
    2. Effect of injection location and strength
    3. Effect of injection pulse duration in time
  4. DISCUSSION AND CONCLUSION

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KEYWORDS and PACS

Keywords

cellular automata, plasma boundary layers, plasma instability, plasma transport processes

PACS

  • 52.25.Fi

    Transport properties

  • 52.35.Qz

    Microinstabilities (ion-acoustic, two-stream, loss-cone, beam-plasma, drift, ion- or electron-cyclotron, etc.)

  • 52.40.Hf

    Plasma-material interactions; boundary layer effects

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3685720

PUBLICATION DATA

ISSN

1070-664X (print)  
1089-7674 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

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